三坐标测量机Zeiss
O-Inspect 442 Zeiss Calypso
三坐标测量机
Zeiss
O-Inspect 442 Zeiss Calypso
製造年份
2012
狀況
二手
位置
Saarbrücken 

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机器数据
价格和位置
- 位置:
- Saarbrücken, 德国
技术细节
- X轴测量范围:
- 400 毫米
- Y轴测量范围:
- 400 毫米
- Z轴测量范围:
- 200 毫米
- X轴行程:
- 400 毫米
- Y轴行程:
- 400 毫米
- Z轴移动距离:
- 200 毫米
- 输入电压:
- 230 V
- 设备:
- 照明, 铭牌可用
优惠详情
- 產品ID:
- A17230982
- 最後更新:
- 於 26.09.2025
描述
Year of manufacture: 2012
Tactile:
Vast XXT
E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250
Scanning probing deviation
MPE according to ISO 10360-4:2000 THP at 2.7 [μm]
Single probe probing deviation form
MPE according to ISO 10360-5:2010
PFTU 1.9 [μm]
Camera system:
Zeiss Discovery 12
EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
Probe deviation MPE according to ISO 10360-7:2011
PF2D 5) 1.7 [μm]
Probe deviation of the image processing system
MPE according to ISO 10360-7:2011
Guodpfxsuq Nfhs Af Aeh
PFV2D 5) 1.2 [μm]
Possible services: delivery, commissioning
Tactile:
Vast XXT
E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250
Scanning probing deviation
MPE according to ISO 10360-4:2000 THP at 2.7 [μm]
Single probe probing deviation form
MPE according to ISO 10360-5:2010
PFTU 1.9 [μm]
Camera system:
Zeiss Discovery 12
EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
Probe deviation MPE according to ISO 10360-7:2011
PF2D 5) 1.7 [μm]
Probe deviation of the image processing system
MPE according to ISO 10360-7:2011
Guodpfxsuq Nfhs Af Aeh
PFV2D 5) 1.2 [μm]
Possible services: delivery, commissioning
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