X射线衍射仪 (XRD)PANalytical
X’Pert PRO MPD
X射线衍射仪 (XRD)
PANalytical
X’Pert PRO MPD
固定价格 不包含增值稅
€13,500
狀況
二手
位置
Borken 

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价格和位置
固定价格 不包含增值稅
€13,500
- 位置:
- Einsteinstraße 8a, 46325 Borken, DE
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优惠详情
- 產品ID:
- A19531791
- 參考編號:
- 24688
- 最後更新:
- 於 10.07.2025
描述
PANalytical
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from the service report:
Device: PANalytical X’Pert PRO MPD
Report date: 07.07.2021
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of goniometer and additional components
- Maintenance carried out, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT
FILTER, WATER
Motor PW3050
("Device was not tested in-house")
Hfsdpfx Aewycatef Aon
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials. It is ideal for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for both routine analyses and complex in-situ experiments.
Key features:
- Multiple measurement geometries possible:
- Reflection measurements in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
- Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
- Modular system with PreFIX technology:
- Rapid change of optics and sample stages without recalibration
- In-situ measurements at high temperatures:
- Measurements up to approx. 1200°C possible
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing atmospheres)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In-situ investigation of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles and pore structures
- Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical data (typical)
Property & Specification
Angle range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: vertical, 0–0, radius approx. 240 mm
Temperature range: room temperature up to approx. 1200°C
Atmosphere: air, N₂, O₂ (limited for reducing atmospheres)
Detectors: X’Celerator (1D), proportional counter
Distribution & application areas:
The X’Pert PRO MPD is in use worldwide at, for example:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g., Max Planck Institutes, ICN2, IS2M)
- Industry (e.g., materials development, pharmaceuticals, chemistry)
Condition: used
Scope of delivery: (See image)
(Specifications and technical data subject to change and error!)
For further questions, we are happy to assist you by phone.
廣告是自動翻譯的,翻譯中可能會出現一些錯誤。
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from the service report:
Device: PANalytical X’Pert PRO MPD
Report date: 07.07.2021
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of goniometer and additional components
- Maintenance carried out, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT
FILTER, WATER
Motor PW3050
("Device was not tested in-house")
Hfsdpfx Aewycatef Aon
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials. It is ideal for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for both routine analyses and complex in-situ experiments.
Key features:
- Multiple measurement geometries possible:
- Reflection measurements in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
- Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
- Modular system with PreFIX technology:
- Rapid change of optics and sample stages without recalibration
- In-situ measurements at high temperatures:
- Measurements up to approx. 1200°C possible
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing atmospheres)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In-situ investigation of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles and pore structures
- Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical data (typical)
Property & Specification
Angle range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: vertical, 0–0, radius approx. 240 mm
Temperature range: room temperature up to approx. 1200°C
Atmosphere: air, N₂, O₂ (limited for reducing atmospheres)
Detectors: X’Celerator (1D), proportional counter
Distribution & application areas:
The X’Pert PRO MPD is in use worldwide at, for example:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g., Max Planck Institutes, ICN2, IS2M)
- Industry (e.g., materials development, pharmaceuticals, chemistry)
Condition: used
Scope of delivery: (See image)
(Specifications and technical data subject to change and error!)
For further questions, we are happy to assist you by phone.
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